DSpace at KISTKIST Conference PaperOthers

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dc.contributor.author김경호-
dc.contributor.authorLee Suyoun-
dc.contributor.authorKim Hyung-jun-
dc.contributor.authorKoo, Hyun Cheol-
dc.contributor.authorHan, Suk Hee-
dc.date.accessioned2024-01-13T03:31:46Z-
dc.date.available2024-01-13T03:31:46Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/102005-
dc.languageEnglish-
dc.subjectPCAR-
dc.subjectspin polarization-
dc.titleNew technique of measuring a spin polarization in patterned device by using scanning point contact Andreev reflection method-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation2008 하계 자기학회-
dc.citation.title2008 하계 자기학회-
dc.citation.conferencePlaceKO-
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