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dc.contributor.authorRavi Kumar-
dc.contributor.authorD. K. Shukla-
dc.contributor.authorS. Mollah-
dc.contributor.authorP. Thakur-
dc.contributor.authorCHAE, KEUN HWA-
dc.contributor.authorCHOI, WON-KOOK-
dc.contributor.authorAbida Bashir-
dc.contributor.authorM. Ikram-
dc.date.accessioned2024-01-13T04:33:55Z-
dc.date.available2024-01-13T04:33:55Z-
dc.date.created2021-09-29-
dc.identifier.issn8183-7203-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/102701-
dc.languageEnglish-
dc.subjectmetal-insulator (MI) transition-
dc.subjectX-ray absorption spectroscopy-
dc.titleElectronic Structure Studies of PrFe1-xNixO3 (x ≤ 0.5) using X-ray Absorption Spectroscopy-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProceedings of the DAE Solid State Physics Symposium, v.52, pp.1013 - 1014-
dc.citation.titleProceedings of the DAE Solid State Physics Symposium-
dc.citation.volume52-
dc.citation.startPage1013-
dc.citation.endPage1014-
dc.citation.conferencePlaceII-
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