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dc.contributor.authorD. K. Shukla-
dc.contributor.authorRavi Kumar-
dc.contributor.authorS. Mollah-
dc.contributor.authorP. Thakur-
dc.contributor.authorCHAE, KEUN HWA-
dc.contributor.authorCHOI, WON-KOOK-
dc.contributor.authorA. Banerjee-
dc.date.accessioned2024-01-13T04:33:56Z-
dc.date.available2024-01-13T04:33:56Z-
dc.date.created2021-09-29-
dc.identifier.issn8183-7203-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/102702-
dc.languageEnglish-
dc.subjectmultiferroic materials-
dc.subjectx-ray absorption spectroscopy-
dc.titleElectronic Structure Studies of BiMn2-xTixO5 (x ≤ 0.5) using x-ray absorption spectroscopy-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProceedings of the DAE Solid State Physics Symposium, v.52, pp.1007 - 1008-
dc.citation.titleProceedings of the DAE Solid State Physics Symposium-
dc.citation.volume52-
dc.citation.startPage1007-
dc.citation.endPage1008-
dc.citation.conferencePlaceII-
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