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dc.contributor.authorNam Ki Cho-
dc.contributor.authorKim, Kwang Woong-
dc.contributor.authorYoon Hong-
dc.contributor.authorPark Sung Jun-
dc.contributor.authorSONG, JIN-DONG-
dc.contributor.authorChoi, Won Jun-
dc.contributor.authorLee, Jung Il-
dc.contributor.authorJun Hun-Su-
dc.date.accessioned2024-01-13T05:32:13Z-
dc.date.available2024-01-13T05:32:13Z-
dc.date.created2021-09-29-
dc.date.issued2007-08-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/103108-
dc.title저밀도 InGaAs 양자점의 CL 측정 결과 분석-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation제33회 한국진공학회 하계학술대회, v.16, no.2, pp.351-
dc.citation.title제33회 한국진공학회 하계학술대회-
dc.citation.volume16-
dc.citation.number2-
dc.citation.startPage351-
dc.citation.endPage351-
dc.citation.conferencePlaceKO-
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