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Dependence of resistive switching characteristics of Pr0.7Ca0.3MnO3 thin films on deposition parameters

Authors

Jung, Sung Mok; Kim, Young Hwan; Yoo, Sang Im; Kim, Yong Tae

Citation

The 14th International Workshop on Oxide Electronics(WOE14), pp.117

Keywords

PCMO thin film; resistive switching; deposition parameters

URI

https://pubs.kist.re.kr/handle/201004/103118

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KIST Conference Paper > Others

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