DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorR. Arvind Singh-
dc.contributor.authorYoon, Eui Sung-
dc.date.accessioned2024-01-13T06:03:15Z-
dc.date.available2024-01-13T06:03:15Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/103454-
dc.languageEnglish-
dc.subjectFriction-
dc.subjectAdhesion-
dc.subjectmicro-
dc.subjectnano-
dc.subjectTribology-
dc.subjectSAM-
dc.subjectDLC-
dc.titleFriction of chemically and topographically modified Si(100) surfaces-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation16th International Conference on Wear of materials, pp.15A.1-
dc.citation.title16th International Conference on Wear of materials-
dc.citation.startPage15A.1-
dc.citation.conferencePlaceUK-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE