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Device Characteristics of Ge-doped SbTe Material System for Phase Change Random Access Memory

Authors

Jeung-hyun Jeong; Lee Suyoun; Wu Zhe; LEE, TAEK SUNG; KIM, WON MOK; Kim Seul-Cham; Kyu Hwan Oh; CHEONG, BYUNG KI

Citation

Materials Research Society

URI

https://pubs.kist.re.kr/handle/201004/103496

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KIST Conference Paper > Others

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