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dc.contributor.authorKim, Jeong-Hun-
dc.contributor.authorKwon sung-do-
dc.contributor.authorJEONG, DAE YONG-
dc.contributor.authorJoo, ByeongKwon-
dc.contributor.authorYOON, SEOK JIN-
dc.contributor.authorKIM, JIN SANG-
dc.date.accessioned2024-01-13T07:02:09Z-
dc.date.available2024-01-13T07:02:09Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/103915-
dc.languageEnglish-
dc.subjectthermoelectrics-
dc.subjectBi2Te3-
dc.subjectMOCVD-
dc.titleStructural Characteristics of Bi2Te3 and Sb2Te3 films on (001) GaAs Substrates grown by MOCVD-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational conference on thermoelectrics-
dc.citation.titleInternational conference on thermoelectrics-
dc.citation.conferencePlaceAU-
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