Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Vaishali Patil | - |
dc.contributor.author | Arun Patil | - |
dc.contributor.author | Ji-Won Choi | - |
dc.contributor.author | YOON, SEOK JIN | - |
dc.date.accessioned | 2024-01-13T07:31:05Z | - |
dc.date.available | 2024-01-13T07:31:05Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/104095 | - |
dc.language | English | - |
dc.subject | PEC | - |
dc.subject | Thin film electrode | - |
dc.subject | Thickness | - |
dc.title | Thickness Dependent Properties of Nanocrystalline Sb2S3 Electrode | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEEE Nanotechnology Materials and Devices Conference 2006, pp.172 - 173 | - |
dc.citation.title | IEEE Nanotechnology Materials and Devices Conference 2006 | - |
dc.citation.startPage | 172 | - |
dc.citation.endPage | 173 | - |
dc.citation.conferencePlace | US | - |
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