Full metadata record

DC Field Value Language
dc.contributor.authorVaishali Patil-
dc.contributor.authorArun Patil-
dc.contributor.authorJi-Won Choi-
dc.contributor.authorYOON, SEOK JIN-
dc.date.accessioned2024-01-13T07:31:05Z-
dc.date.available2024-01-13T07:31:05Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/104095-
dc.languageEnglish-
dc.subjectPEC-
dc.subjectThin film electrode-
dc.subjectThickness-
dc.titleThickness Dependent Properties of Nanocrystalline Sb2S3 Electrode-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE Nanotechnology Materials and Devices Conference 2006, pp.172 - 173-
dc.citation.titleIEEE Nanotechnology Materials and Devices Conference 2006-
dc.citation.startPage172-
dc.citation.endPage173-
dc.citation.conferencePlaceUS-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE