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dc.contributor.authorKim, Yong Tae-
dc.contributor.authorPark Yu Jin-
dc.contributor.authorKwon Young Suk-
dc.contributor.authorYoum Minsoo-
dc.contributor.authorSung Man Young-
dc.date.accessioned2024-01-13T07:32:48Z-
dc.date.available2024-01-13T07:32:48Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/104213-
dc.languageEnglish-
dc.subjectPRAM-
dc.titleEFFECTS OF SCALED CONTACT DIMENSION ON PHASE CHANGE RANDOM ACCESS MEMORY-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational Symposium on Integrated Ferroelectrics-
dc.citation.titleInternational Symposium on Integrated Ferroelectrics-
dc.citation.conferencePlaceUS-
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