DSpace at KIST: An NSOM measurement of the near-field intensity profile of transmitted light due to a PbTe thin film material for super-resolution optical memory

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DC Field	Value	Language
dc.contributor.author	LEE, TAEK SUNG	-
dc.contributor.author	Lee Hyun Seok	-
dc.contributor.author	Jeung-hyun Jeong	-
dc.contributor.author	Dae-Hwan Kang	-
dc.contributor.author	KIM, WON MOK	-
dc.contributor.author	S.T.Whang	-
dc.contributor.author	K.M.Cho	-
dc.contributor.author	CHEONG, BYUNG KI	-
dc.date.accessioned	2024-01-13T08:31:05Z	-
dc.date.available	2024-01-13T08:31:05Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/104627	-
dc.language	English	-
dc.subject	optical memory	-
dc.subject	near-field	-
dc.subject	super-resolution	-
dc.subject	PbTe	-
dc.subject	thermo-electric	-
dc.title	An NSOM measurement of the near-field intensity profile of transmitted light due to a PbTe thin film material for super-resolution optical memory	-
dc.title.alternative	근접장 주사현미경을 이용한 초해상 광메모리용 PbTe 박막 투과광의 근접장 강도분포 측정	-
dc.type	Conference	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	Photonics Conference 2005, pp.161 - 162	-
dc.citation.title	Photonics Conference 2005	-
dc.citation.startPage	161	-
dc.citation.endPage	162	-
dc.citation.conferencePlace	KO	-

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