Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Sang Soo | - |
| dc.contributor.author | Lee, Chang Jin | - |
| dc.contributor.author | Kim, Soo Won | - |
| dc.contributor.author | LEE, SEUNG BOK | - |
| dc.contributor.author | Bae, Gwi-Nam | - |
| dc.contributor.author | Moon, Kil Choo (K.C) | - |
| dc.date.accessioned | 2024-01-13T09:01:50Z | - |
| dc.date.available | 2024-01-13T09:01:50Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/104945 | - |
| dc.language | English | - |
| dc.subject | ultrafine particle | - |
| dc.subject | electrometer | - |
| dc.subject | charging | - |
| dc.title | A novel ultrafine particle measurement system with an electrometer | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 2005 IEEE International Midwest Symposium on Circuits and Systems, pp.70 | - |
| dc.citation.title | 2005 IEEE International Midwest Symposium on Circuits and Systems | - |
| dc.citation.startPage | 70 | - |
| dc.citation.endPage | 70 | - |
| dc.citation.conferencePlace | US | - |
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