Full metadata record

DC Field Value Language
dc.contributor.authorBambang Veriabsyah-
dc.contributor.authorKim, Jae Duck-
dc.contributor.authorYoun-Woo Lee-
dc.date.accessioned2024-01-13T09:03:11Z-
dc.date.available2024-01-13T09:03:11Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/105034-
dc.languageEnglish-
dc.subjectSupercritical-
dc.subjectOxidation-
dc.subjectWastewater-
dc.subjectLCD-
dc.titleSimultaneous Removal of Chromium Ion and Organic Pollutants from the LCD Manufacturing Plant Wastewater by Supercritical Water oxidation-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational Symposium on Supercritical Fluids 2005-
dc.citation.titleInternational Symposium on Supercritical Fluids 2005-
dc.citation.conferencePlaceUS-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE