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dc.contributor.authorHAN YONG HEE-
dc.contributor.authorKim Kun Tae-
dc.contributor.authorNGUYEN CHI ANH-
dc.contributor.authorShin, Hyun Joon-
dc.contributor.authorChoi In Hoon-
dc.contributor.authorMoon, Sung Wook-
dc.date.accessioned2024-01-13T10:32:57Z-
dc.date.available2024-01-13T10:32:57Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/105813-
dc.languageEnglish-
dc.subjectvanadium-tungsten alloy-
dc.subjectoxidation-
dc.subjectmicrobolometer-
dc.titleFabrication and characterization of bolometric oxide thin film based on vanadium-tungsten alloy-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationEUROSENSORS 2004-
dc.citation.titleEUROSENSORS 2004-
dc.citation.conferencePlaceIT-
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KIST Conference Paper > Others
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