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dc.contributor.authorHan, Il Ki-
dc.contributor.authorPark, Young Ju-
dc.contributor.authorChoi, Won Jun-
dc.contributor.authorLee, Jung Il-
dc.date.accessioned2024-01-13T11:00:38Z-
dc.date.available2024-01-13T11:00:38Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/105930-
dc.languageEnglish-
dc.subjectpoly-Si TFT&apos-
dc.subjects-
dc.subject1/f noise-
dc.subject다결정실리콘 박막 트랜지스터-
dc.subject1/f 잡음-
dc.title1/f noise in large grain Poly-Si TFT's-
dc.title.alternative큰 알갱이 다결정실리콘 박막 트랜지스터의 1/f 잡음-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationAWAD2003(2003Asia-Pacific Workshop on Fundamentals and Applications of Advanced SemiconductorDevices, pp.129 - 132-
dc.citation.titleAWAD2003(2003Asia-Pacific Workshop on Fundamentals and Applications of Advanced SemiconductorDevices-
dc.citation.startPage129-
dc.citation.endPage132-
dc.citation.conferencePlaceKO-
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