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dc.contributor.author박세준-
dc.contributor.authorEUN KWANG YONG-
dc.contributor.authorLee Kwang Ryeol-
dc.contributor.authorAndreas Scholl-
dc.contributor.authorFrithjof Nolting-
dc.contributor.authorH. Padmore-
dc.date.accessioned2024-01-13T13:34:16Z-
dc.date.available2024-01-13T13:34:16Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/107495-
dc.languageEnglish-
dc.subjectpnotoemission electron microscopic analysis-
dc.titlePEEM and NEXAFS analysis of wear debris of Si incorporated dianomd like carbon films in various envrionments-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProceedings of the Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conferen, pp.454-
dc.citation.titleProceedings of the Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint Conferen-
dc.citation.startPage454-
dc.citation.endPage454-
dc.citation.conferencePlaceUS-
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