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dc.contributor.authorDong-Ho Kim-
dc.contributor.authorLEE YUN HI-
dc.contributor.authorChang-Woo Lee-
dc.contributor.authorYoon-Taek Jang-
dc.contributor.authorChang-Hoon Choi-
dc.contributor.authorGyu-Tae Kim-
dc.contributor.authorEun-Kyu Kim-
dc.contributor.authorJu Byeong Kwon-
dc.contributor.authorJae-Eun Lee-
dc.contributor.authorYoung-Soo Hahn-
dc.contributor.authorSang-Soo Yoon-
dc.contributor.authorJin-Koog Shin-
dc.contributor.authorSung-Tae Kim-
dc.date.accessioned2024-01-13T14:00:49Z-
dc.date.available2024-01-13T14:00:49Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/107542-
dc.languageEnglish-
dc.subjectdirect nanowiring-
dc.titleTemperature dependence of field effect function of a direct bridged CNT between ferromagnetic electrodes: Ni as both catalyst and contact electrode-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationNanotube 2001, pp.65-
dc.citation.titleNanotube 2001-
dc.citation.startPage65-
dc.citation.endPage65-
dc.citation.conferencePlaceGW-
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