Full metadata record

DC Field Value Language
dc.contributor.authorHeung-Woo Park-
dc.contributor.authorYun-Kwon Park-
dc.contributor.authorDuck-Jung Lee-
dc.contributor.authorChul-Ju Kim-
dc.contributor.authorJung-Ho Park-
dc.contributor.authorOH MYUNG HWAN-
dc.contributor.authorJu Byeong Kwon-
dc.date.accessioned2024-01-13T14:33:41Z-
dc.date.available2024-01-13T14:33:41Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/107990-
dc.languageEnglish-
dc.subjectpackaging-
dc.titleVacuum in-line packaging and characterization of the surface-micromachined vacuum magnetic field sensors-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationProceedings of the International Sensor Conference 2001, pp.29 - 30.-
dc.citation.titleProceedings of the International Sensor Conference 2001-
dc.citation.startPage29-
dc.citation.endPage30.-
dc.citation.conferencePlaceKO-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE