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dc.contributor.authorKim, Yong Tae-
dc.contributor.author최훈상-
dc.contributor.author박건상-
dc.contributor.author최인훈-
dc.date.accessioned2024-01-13T15:04:54Z-
dc.date.available2024-01-13T15:04:54Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/108303-
dc.languageEnglish-
dc.subjectSrBi2Ta2O9-
dc.titleEffects of voltage distribution in Pt/SrBi2Ta2O9/Ta2O5/Si structure on memory window of ferroelectric gate-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation12th IEEE International Symposium on Applications of Ferroelectrics-
dc.citation.title12th IEEE International Symposium on Applications of Ferroelectrics-
dc.citation.conferencePlaceUS-
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