DSpace at KIST: Characterization of Pt-doped V₂ O//5 thin film for cathode of thin film battery by a direct current reactive sputtering method

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DC Field	Value	Language
dc.contributor.author	Yoon Young Soo	-
dc.contributor.author	전은정	-
dc.contributor.author	NAM SANG CHUL	-
dc.contributor.author	Cho Won Il	-
dc.date.accessioned	2024-01-13T15:32:24Z	-
dc.date.available	2024-01-13T15:32:24Z	-
dc.date.created	2021-09-29	-
dc.identifier.issn	1091-8213	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/108422	-
dc.language	English	-
dc.subject	thin film battery	-
dc.title	Characterization of Pt-doped V₂ O//5 thin film for cathode of thin film battery by a direct current reactive sputtering method	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	The 197th Meeting of the Electrochemical Society, v.2000, no.1, pp.47	-
dc.citation.title	The 197th Meeting of the Electrochemical Society	-
dc.citation.volume	2000	-
dc.citation.number	1	-
dc.citation.startPage	47	-
dc.citation.endPage	47	-
dc.citation.conferencePlace	US	-

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