DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorLEE YEON HEE-
dc.contributor.authorHAN SEUNG HEE-
dc.contributor.author윤정현-
dc.contributor.authorKIM YOUNG MAN-
dc.contributor.author손성건-
dc.contributor.author박성우-
dc.date.accessioned2024-01-13T16:31:54Z-
dc.date.available2024-01-13T16:31:54Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/108945-
dc.languageEnglish-
dc.subjectTOF-SIMS-
dc.titleIdentification of automotive paints using time-of-flight secondary ion mass spectrometry-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationProceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, pp.773 - 776-
dc.citation.titleProceedings of the 12th International Conference on Secondary Ion Mass Spectrometry-
dc.citation.startPage773-
dc.citation.endPage776-
dc.citation.conferencePlaceBE-
Appears in Collections:
KIST Conference Paper > Others
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE