Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | H. Kim | - |
dc.contributor.author | Ju Byeong Kwon | - |
dc.contributor.author | S. Lee | - |
dc.contributor.author | LEE YUN HI | - |
dc.contributor.author | OH MYUNG HWAN | - |
dc.contributor.author | 고영욱 | - |
dc.contributor.author | J. Jang | - |
dc.date.accessioned | 2024-01-13T17:01:59Z | - |
dc.date.available | 2024-01-13T17:01:59Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.issn | 0099-0966 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/109214 | - |
dc.language | English | - |
dc.subject | FED | - |
dc.subject | FEA | - |
dc.subject | MEMS | - |
dc.title | The influence of gate insulator etching on the characteristics of Mo-tip field-emitter arrays | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | SID 99 Digest, pp.930 - 933 | - |
dc.citation.title | SID 99 Digest | - |
dc.citation.startPage | 930 | - |
dc.citation.endPage | 933 | - |
dc.citation.conferencePlace | US | - |
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