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Electrical properties of interfaces and turn-on characteristics of TFEL devices

Authors

LEE YUN HI; SHIN KYEONG SIK; KIM YOUNG SIK; 장윤택; Ju Byeong Kwon; OH MYUNG HWAN; 성만영

Citation

SID 99 Digest, pp.600 - 603

Keywords

ELD; thin film; phosphor

ISSN

0099-0966

URI

https://pubs.kist.re.kr/handle/201004/109234

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KIST Conference Paper > Others

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