DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorLEE KYEONG SEOK-
dc.contributor.author백성기-
dc.date.accessioned2024-01-13T17:30:40Z-
dc.date.available2024-01-13T17:30:40Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/109399-
dc.languageEnglish-
dc.subjectdomain structure-
dc.subjectsynchrotron X-ray diffraction-
dc.subjectepitaxial PZT thin film-
dc.titleMicrostructural characterization of epitaxial PbTiO ₃ thin films usig synchrotron X-ray diffraction-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation11th International Symposium on Integrated Ferroelectrics, Colorado, USA, March 7-10, 1999., pp.?-
dc.citation.title11th International Symposium on Integrated Ferroelectrics, Colorado, USA, March 7-10, 1999.-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceUS-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE