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dc.contributor.authorHo Nyung Lee-
dc.contributor.author신동석-
dc.contributor.authorKim Yong Tae-
dc.contributor.author조성호-
dc.date.accessioned2024-01-13T18:31:23Z-
dc.date.available2024-01-13T18:31:23Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/109981-
dc.languageEnglish-
dc.subjectFerroelectrics-
dc.titleInfluence of rapid thermal annealing of cerium oxide on the morphological and electrical properties of metal/ferroelectric/insulator/semiconductor capacitor-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationThe 4th International Conference on Electronic Materials, pp.?-
dc.citation.titleThe 4th International Conference on Electronic Materials-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceKO-
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KIST Conference Paper > Others
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