Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE JAE KAP | - |
| dc.contributor.author | Lee Wook Seong | - |
| dc.contributor.author | EUN KWANG YONG | - |
| dc.contributor.author | Baik Young Joon | - |
| dc.date.accessioned | 2024-01-13T18:32:47Z | - |
| dc.date.available | 2024-01-13T18:32:47Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/110067 | - |
| dc.language | English | - |
| dc.subject | large area diamond deposition | - |
| dc.title | Characterization of thick diamond film wafer grown by multi-cathode Direct Current (DC) Plasma Assisted Chemical Vapor Deposition (PACVD) | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | Proc. of International Workshop on Surface Engineering and Technology, 1998, Bangalore, India, pp.7 | - |
| dc.citation.title | Proc. of International Workshop on Surface Engineering and Technology, 1998, Bangalore, India | - |
| dc.citation.startPage | 7 | - |
| dc.citation.endPage | 7 | - |
| dc.citation.conferencePlace | KO | - |
- Appears in Collections:
- KIST Conference Paper > Others
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