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dc.contributor.author오문성-
dc.contributor.author정경민-
dc.contributor.authorKIM TEA JUNG-
dc.contributor.author김영동-
dc.contributor.author유상덕-
dc.contributor.authorD.E. Aspnes-
dc.contributor.authorCHOI SUKGEUN-
dc.contributor.authorWoo Deok Ha-
dc.contributor.authorKim Sun Ho-
dc.date.accessioned2024-01-13T19:00:23Z-
dc.date.available2024-01-13T19:00:23Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/110184-
dc.languageEnglish-
dc.subjecteliipsometry-
dc.subjectAlGaP-
dc.subjectdielectric-
dc.titleDielectric functions of AlxGa₁-xP films-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국물리학회 연구논문발표회, pp.29-
dc.citation.title한국물리학회 연구논문발표회-
dc.citation.startPage29-
dc.citation.endPage29-
dc.citation.conferencePlaceKO-
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