Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim Yong Tae | - |
| dc.contributor.author | Min Suk-Ki | - |
| dc.date.accessioned | 2024-01-13T21:02:22Z | - |
| dc.date.available | 2024-01-13T21:02:22Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/111358 | - |
| dc.language | English | - |
| dc.title | Direct shrinkage observation of oxidation induced stacking faults in p-type CZ silicon. | - |
| dc.type | Conference | - |
| dc.description.journalClass | 2 | - |
| dc.identifier.bibliographicCitation | Proc. 1986 Seoul int. symp. phys. semicond. & appl., pp.? | - |
| dc.citation.title | Proc. 1986 Seoul int. symp. phys. semicond. & appl. | - |
| dc.citation.startPage | ? | - |
| dc.citation.endPage | ? | - |
| dc.citation.conferencePlace | KO | - |
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