High quality silicon-nitride thin films grown by helium plasma-enhanced chemical vapor deposition

Authors
S. LimS. J. KimJung Jae HoonJu Byeong KwonOH MYUNG HWANJ. F. Wager
Citation
Technical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia., pp.406 - 410
Keywords
insulating film; field emission display
URI
https://pubs.kist.re.kr/handle/201004/111374
Appears in Collections:
KIST Conference Paper > Others
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