DSpace at KIST: Time-of-flight secondary ion mass spectrometry of substituted polystyrenes.

Full metadata record

DC Field	Value	Language
dc.contributor.author	LEE YEON HEE	-
dc.contributor.author	HAN SEUNG HEE	-
dc.date.accessioned	2024-01-13T21:30:54Z	-
dc.date.available	2024-01-13T21:30:54Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/111552	-
dc.language	English	-
dc.subject	TOF-SIMS	-
dc.subject	substituted polystyrenes	-
dc.subject	MALDI	-
dc.title	Time-of-flight secondary ion mass spectrometry of substituted polystyrenes.	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	Proceedings of the 44th ASMS Conference on Mass Spectrometry, pp.894	-
dc.citation.title	Proceedings of the 44th ASMS Conference on Mass Spectrometry	-
dc.citation.startPage	894	-
dc.citation.endPage	894	-
dc.citation.conferencePlace	US	-

Show Simple Item Record

KIST Library Institutional Repository