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dc.contributor.authorKum Dong Wha-
dc.contributor.authorByun Dongjin-
dc.contributor.authorKim Gyeung Ho-
dc.date.accessioned2024-01-13T21:31:11Z-
dc.date.available2024-01-13T21:31:11Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111570-
dc.languageEnglish-
dc.titleThe effect of surface morphology on the defect density of GaN..-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation8th Seoul inter. symp. on the physics of semiconductors and applications-1996(96-ISPSA), Oct. 21-22,, pp.?-
dc.citation.title8th Seoul inter. symp. on the physics of semiconductors and applications-1996(96-ISPSA), Oct. 21-22,-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceKO-
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