DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorW. J. Choi-
dc.contributor.authorLee Seok-
dc.contributor.authorD. Woo-
dc.contributor.authorLee Jung Il-
dc.contributor.authorS. K. Kim-
dc.contributor.authorJ. H. Chu-
dc.contributor.authorS. K. Yu-
dc.contributor.authorKANG KWANG NHAM-
dc.contributor.authorD. Kim-
dc.contributor.authorK. Cho-
dc.date.accessioned2024-01-13T22:04:04Z-
dc.date.available2024-01-13T22:04:04Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/112004-
dc.languageEnglish-
dc.subjectquantum well disordering-
dc.titleCarrier lifetime in dielectric cap disordered GaAs/AlGaAs quantum well by SiN capping layer.-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationCLEO/QELS '95, Baltimore, USA, pp.?-
dc.citation.titleCLEO/QELS '95, Baltimore, USA-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceUS-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE