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dc.contributor.authorKANG KWANG NHAM-
dc.contributor.authorW. J. Choi-
dc.contributor.authorS. Lee-
dc.contributor.authorY. Kim-
dc.contributor.authorLee Jung Il-
dc.contributor.authorS. K. Kim-
dc.date.accessioned2024-01-13T22:04:38Z-
dc.date.available2024-01-13T22:04:38Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/112038-
dc.languageEnglish-
dc.subjectquantum well disordering-
dc.titleQuantum well disordering by using plasma enhanced chemical vapor deposited SiN//x film as a capping layer.-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIst Korea-Chinese semiconductor conference, Beijing, China, pp.?-
dc.citation.titleIst Korea-Chinese semiconductor conference, Beijing, China-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceCC-
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KIST Conference Paper > Others
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