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dc.contributor.authorKim Gyeung Ho-
dc.date.accessioned2024-01-13T22:33:26Z-
dc.date.available2024-01-13T22:33:26Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/112234-
dc.languageKorean-
dc.title수렴성 비임 전자회절법을 이용한 열응력의 측정 .-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation'94 전자현미경학회 추계학술대회, pp.279 - 295-
dc.citation.title'94 전자현미경학회 추계학술대회-
dc.citation.startPage279-
dc.citation.endPage295-
dc.citation.conferencePlaceKO-
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