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dc.contributor.authorKANG KWANG NHAM-
dc.contributor.authorLee Jung Il-
dc.contributor.author최병두-
dc.contributor.authorKIM CHOONG HWAN-
dc.contributor.author임한조-
dc.contributor.authorHan Il Ki-
dc.date.accessioned2024-01-13T23:02:42Z-
dc.date.available2024-01-13T23:02:42Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/112456-
dc.languageEnglish-
dc.subjectInP MIS structures-
dc.titleCharge trapping instabilities in SiO2/InP MIS structures.-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국 물리학회 학술발표회 , 국방과학 연구소, pp.?-
dc.citation.title한국 물리학회 학술발표회 , 국방과학 연구소-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceKO-
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