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dc.contributor.authorKim Seong Il-
dc.contributor.authorMin Suk-Ki-
dc.contributor.authorCHOI WON CHEOL-
dc.contributor.authorKIM EUN KYU-
dc.contributor.authorCHO HOON YOUNG-
dc.contributor.authorKIM CHUN KEUN-
dc.date.accessioned2024-01-13T23:04:13Z-
dc.date.available2024-01-13T23:04:13Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/112547-
dc.languageEnglish-
dc.subjectsilicon-
dc.subjectdefect-
dc.subjectlaser-
dc.titleDefect states in silicon after laser processing.-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitationBull. Korean phys. soc., v.v. 9, no.no. 1, pp.66 - ?-
dc.citation.titleBull. Korean phys. soc.-
dc.citation.volumev. 9-
dc.citation.numberno. 1-
dc.citation.startPage66-
dc.citation.endPage?-
dc.citation.conferencePlaceKO-
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