Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim Seong Il | - |
dc.contributor.author | Min Suk-Ki | - |
dc.contributor.author | CHOI WON CHEOL | - |
dc.contributor.author | KIM EUN KYU | - |
dc.contributor.author | CHO HOON YOUNG | - |
dc.contributor.author | KIM CHUN KEUN | - |
dc.date.accessioned | 2024-01-13T23:04:13Z | - |
dc.date.available | 2024-01-13T23:04:13Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/112547 | - |
dc.language | English | - |
dc.subject | silicon | - |
dc.subject | defect | - |
dc.subject | laser | - |
dc.title | Defect states in silicon after laser processing. | - |
dc.type | Conference | - |
dc.description.journalClass | 2 | - |
dc.identifier.bibliographicCitation | Bull. Korean phys. soc., v.v. 9, no.no. 1, pp.66 - ? | - |
dc.citation.title | Bull. Korean phys. soc. | - |
dc.citation.volume | v. 9 | - |
dc.citation.number | no. 1 | - |
dc.citation.startPage | 66 | - |
dc.citation.endPage | ? | - |
dc.citation.conferencePlace | KO | - |
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