Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ju Byeong Kwon | - |
| dc.contributor.author | S. R. Rho | - |
| dc.contributor.author | C. J. Kim | - |
| dc.date.accessioned | 2024-01-13T23:33:52Z | - |
| dc.date.available | 2024-01-13T23:33:52Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/112790 | - |
| dc.language | English | - |
| dc.subject | silicon on insulator | - |
| dc.subject | SOI device | - |
| dc.title | Electron diffraction patterns from Si-BP films epitaxially grown on Si substrates | - |
| dc.type | Conference | - |
| dc.description.journalClass | 2 | - |
| dc.identifier.bibliographicCitation | IEEE region 10 conference, Seoul, Korea., pp.1252 - 1256 | - |
| dc.citation.title | IEEE region 10 conference, Seoul, Korea. | - |
| dc.citation.startPage | 1252 | - |
| dc.citation.endPage | 1256 | - |
| dc.citation.conferencePlace | KO | - |
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