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dc.contributor.authorJung, Seung Geun-
dc.contributor.authorKim, Jinsik-
dc.contributor.authorHwang, Kyo Seon-
dc.contributor.authorYu, Hyun-Yong-
dc.contributor.authorLee, Byung Chul-
dc.date.accessioned2024-01-19T11:09:22Z-
dc.date.available2024-01-19T11:09:22Z-
dc.date.created2022-03-01-
dc.date.issued2016-11-03-
dc.identifier.issn1948-5719-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/114692-
dc.description.abstractIn this paper, we present design guideline and simulation results of capacitive micromachined ultrasonic transducer (CMUT) embedded field effect transistor (FET) for high frequency mode operation. The CMUT-FET consists of a mechanical CMUT part and an electrical sensing FET part. The device has a characteristic of a shared gate dielectric between a CMUT and an FET; hence, the gate capacitance change in the CMUT part can be reflected to the FET current as pressure changes. With an FET's current amplifying characteristic, the CMUT-FET makes it possible to achieve higher sensitivity and high resonant frequency with smaller element pitch and smaller active cell area than existing CMUTs. Combination of a 3-D finite element analysis (FEA) model of the CMUT part and a commercial technology computer aided design (TCAD) simulation of the FET device was used for inspection of the CMUT-FET device performance. In the 3-D FEA simulation, we focused on investigating pull-in voltage and electrical potential of a rectangular CMUT plate which have 20MHz resonant frequency in immersion with different dimensions. The FET part simulation was performed with variation of gate oxide thickness, source/drain doping concentration, channel doping concentration, substrate doping concentration. We combined data and inspected overall device performance with pressure variation at specific gate voltage and optimized the factor above-mentioned to get high sensitivity. Simulation results show that the optimized model has the collapse voltage of 13AV and the pressure sensitivity of 11.34 mu A/Pa at gate voltage of 11V.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titlePerformance Analysis and Design of FET-Embedded Capacitive Micromachined Ultrasonic Transducer (CMUT)-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE International Ultrasonics Symposium (IUS)-
dc.citation.titleIEEE International Ultrasonics Symposium (IUS)-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceTours, FRANCE-
dc.citation.conferenceDate2016-09-18-
dc.relation.isPartOf2016 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS)-
dc.identifier.wosid000387497400234-
dc.identifier.scopusid2-s2.0-84996536331-
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KIST Conference Paper > 2016
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