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dc.contributor.authorZhao, Jiuxuan-
dc.contributor.authorMilanese, Tommaso-
dc.contributor.authorGramuglia, Francesco-
dc.contributor.authorKeshavarzian, Pouyan-
dc.contributor.authorTan, Shyue Seng-
dc.contributor.authorTng, Michelle-
dc.contributor.authorLim, Louis-
dc.contributor.authorDhulla, Vinit-
dc.contributor.authorQuek, Elgin-
dc.contributor.authorLee, Myung-Jae-
dc.contributor.authorCharbon, Edoardo-
dc.date.accessioned2024-01-19T11:30:58Z-
dc.date.available2024-01-19T11:30:58Z-
dc.date.created2022-05-24-
dc.date.issued2022-09-
dc.identifier.issn1077-260X-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/114765-
dc.description.abstractWe present an analog silicon photomultiplier (SiPM) based on a standard 55-nm Bipolar-CMOS-DMOS (BCD) technology. The SiPM is composed of 16 x 16 single-photon avalanche diodes (SPADs) and measures 0.29 x 0.32 mm(2). Each SPAD cell is passively quenched by a monolithically integrated 3.3 V thick oxide transistor. The measured gain is 3.4 x 10(5) at 5 V excess bias voltage. The single-photon timing resolution (SPTR) is 185 ps and the multi-photon timing resolution (MPTR) is 120 ps at 3.3 V excess bias voltage. We integrate the SiPM into a co-axial light detection and ranging (LiDAR) system with a time-correlated single-photon counting (TCSPC) module in FPGA. The depth measurement up to 25 m achieves an accuracy of 2 cm and precision of 2 mm under the room ambient light condition. With co-axial scanning, the intensity and depth images of complex scenes with resolutions of 128 x 256 and 256 x 512 are demonstrated. The presented SiPM enables the development of cost-effective LiDAR system-on-chip (SoC) in the advanced technology.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.titleOn Analog Silicon Photomultipliers in Standard 55-nm BCD Technology for LiDAR Applications-
dc.typeArticle-
dc.identifier.doi10.1109/JSTQE.2022.3161089-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE Journal on Selected Topics in Quantum Electronics, v.28, no.5-
dc.citation.titleIEEE Journal on Selected Topics in Quantum Electronics-
dc.citation.volume28-
dc.citation.number5-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000790571400001-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryQuantum Science & Technology-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordPlusTO-DIGITAL CONVERTER-
dc.subject.keywordPlusLARGE-AREA-
dc.subject.keywordPlusSIPM-
dc.subject.keywordAuthorSingle-photon avalanche diode-
dc.subject.keywordAuthorSPAD-
dc.subject.keywordAuthorsilicon photomultiplier-
dc.subject.keywordAuthorSiPM-
dc.subject.keywordAuthorCMOS-
dc.subject.keywordAuthorBCD-
dc.subject.keywordAuthortime-correlated single-photon counting-
dc.subject.keywordAuthorTCSPC-
dc.subject.keywordAuthorLiDAR-
dc.subject.keywordAuthorco-axial scanning-
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