Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gramuglia, F. | - |
dc.contributor.author | Wu, M. | - |
dc.contributor.author | Bruschini, C. | - |
dc.contributor.author | Lee, M. | - |
dc.contributor.author | Charbon, E. | - |
dc.date.accessioned | 2024-01-19T12:33:05Z | - |
dc.date.available | 2024-01-19T12:33:05Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 2022-03 | - |
dc.identifier.issn | 1077-260X | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/115620 | - |
dc.description.abstract | In this paper, we present the first CMOS SPAD with performance comparable or better than that of the best custom SPADs, to date. The SPAD-based design, fully integrated in 180 nm CMOS technology, achieves a peak PDP of 55% at 480nm with a very broad spectrum spanning from NUV to NIF and a normalized DCR of 0.2cps/m2, both at 6V of excess bias. Thanks to a dedicated CMOS pixel circuit front-end, an afterpulsing probability of about 0.1% at a dead time of3ns were achieved. We designed three SPADs with a diameter of 25, 50, and 100m to study the impact of size on the timing jitter and to create a scaling law for SPADs. For these SPADs, a SPTR of 12.1ps, 16ps, and 27ps was achieved at 6V of excess bias, respectively. The SPADs operate in a wide range of temperatures, from -65C to 40C, reaching a normalized DCR of 1.6 mcps/m2 at 6V of excess bias. The proposed SPADs are ideal for a wide range of applications, including LiDAR, super-resolution microscopy, QRNGs, QKD, fluorescence lifetime imaging, time-resolved Raman spectroscopy, to name a few. CCBY | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | A Low-noise CMOS SPAD Pixel with 12.1 ps SPTR and 3 ns Dead Time | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/JSTQE.2021.3088216 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEEE Journal of Selected Topics in Quantum Electronics, v.28, no.2 | - |
dc.citation.title | IEEE Journal of Selected Topics in Quantum Electronics | - |
dc.citation.volume | 28 | - |
dc.citation.number | 2 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000763132400001 | - |
dc.identifier.scopusid | 2-s2.0-85111031827 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Quantum Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalResearchArea | Optics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | Fluorescence imaging | - |
dc.subject.keywordPlus | Pixels | - |
dc.subject.keywordPlus | Afterpulsing | - |
dc.subject.keywordPlus | Broad spectrum | - |
dc.subject.keywordPlus | CMOS technology | - |
dc.subject.keywordPlus | Fluorescence lifetime imaging | - |
dc.subject.keywordPlus | Fully integrated | - |
dc.subject.keywordPlus | Pixel circuit | - |
dc.subject.keywordPlus | Super-resolution microscopy | - |
dc.subject.keywordPlus | Time-resolved Raman spectroscopies | - |
dc.subject.keywordPlus | CMOS integrated circuits | - |
dc.subject.keywordAuthor | Active reset | - |
dc.subject.keywordAuthor | cascode | - |
dc.subject.keywordAuthor | CMOS technology | - |
dc.subject.keywordAuthor | Delays | - |
dc.subject.keywordAuthor | jitter | - |
dc.subject.keywordAuthor | low noise | - |
dc.subject.keywordAuthor | low power | - |
dc.subject.keywordAuthor | photon detection probability (PDP) | - |
dc.subject.keywordAuthor | pixel | - |
dc.subject.keywordAuthor | quantum key distribution (QKD) | - |
dc.subject.keywordAuthor | Sensitivity | - |
dc.subject.keywordAuthor | single-photon avalanche diode (SPAD) | - |
dc.subject.keywordAuthor | Single-photon avalanche diodes | - |
dc.subject.keywordAuthor | Temperature measurement | - |
dc.subject.keywordAuthor | timing | - |
dc.subject.keywordAuthor | Transistors | - |
dc.subject.keywordAuthor | Voltage measurement | - |
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