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dc.contributor.authorGramuglia, F.-
dc.contributor.authorWu, M.-
dc.contributor.authorBruschini, C.-
dc.contributor.authorLee, M.-
dc.contributor.authorCharbon, E.-
dc.date.accessioned2024-01-19T12:33:05Z-
dc.date.available2024-01-19T12:33:05Z-
dc.date.created2022-01-10-
dc.date.issued2022-03-
dc.identifier.issn1077-260X-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/115620-
dc.description.abstractIn this paper, we present the first CMOS SPAD with performance comparable or better than that of the best custom SPADs, to date. The SPAD-based design, fully integrated in 180 nm CMOS technology, achieves a peak PDP of 55% at 480nm with a very broad spectrum spanning from NUV to NIF and a normalized DCR of 0.2cps/m2, both at 6V of excess bias. Thanks to a dedicated CMOS pixel circuit front-end, an afterpulsing probability of about 0.1% at a dead time of3ns were achieved. We designed three SPADs with a diameter of 25, 50, and 100m to study the impact of size on the timing jitter and to create a scaling law for SPADs. For these SPADs, a SPTR of 12.1ps, 16ps, and 27ps was achieved at 6V of excess bias, respectively. The SPADs operate in a wide range of temperatures, from -65C to 40C, reaching a normalized DCR of 1.6 mcps/m2 at 6V of excess bias. The proposed SPADs are ideal for a wide range of applications, including LiDAR, super-resolution microscopy, QRNGs, QKD, fluorescence lifetime imaging, time-resolved Raman spectroscopy, to name a few. CCBY-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleA Low-noise CMOS SPAD Pixel with 12.1 ps SPTR and 3 ns Dead Time-
dc.typeArticle-
dc.identifier.doi10.1109/JSTQE.2021.3088216-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE Journal of Selected Topics in Quantum Electronics, v.28, no.2-
dc.citation.titleIEEE Journal of Selected Topics in Quantum Electronics-
dc.citation.volume28-
dc.citation.number2-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000763132400001-
dc.identifier.scopusid2-s2.0-85111031827-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryQuantum Science & Technology-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordPlusFluorescence imaging-
dc.subject.keywordPlusPixels-
dc.subject.keywordPlusAfterpulsing-
dc.subject.keywordPlusBroad spectrum-
dc.subject.keywordPlusCMOS technology-
dc.subject.keywordPlusFluorescence lifetime imaging-
dc.subject.keywordPlusFully integrated-
dc.subject.keywordPlusPixel circuit-
dc.subject.keywordPlusSuper-resolution microscopy-
dc.subject.keywordPlusTime-resolved Raman spectroscopies-
dc.subject.keywordPlusCMOS integrated circuits-
dc.subject.keywordAuthorActive reset-
dc.subject.keywordAuthorcascode-
dc.subject.keywordAuthorCMOS technology-
dc.subject.keywordAuthorDelays-
dc.subject.keywordAuthorjitter-
dc.subject.keywordAuthorlow noise-
dc.subject.keywordAuthorlow power-
dc.subject.keywordAuthorphoton detection probability (PDP)-
dc.subject.keywordAuthorpixel-
dc.subject.keywordAuthorquantum key distribution (QKD)-
dc.subject.keywordAuthorSensitivity-
dc.subject.keywordAuthorsingle-photon avalanche diode (SPAD)-
dc.subject.keywordAuthorSingle-photon avalanche diodes-
dc.subject.keywordAuthorTemperature measurement-
dc.subject.keywordAuthortiming-
dc.subject.keywordAuthorTransistors-
dc.subject.keywordAuthorVoltage measurement-
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