DSpace at KISTKIST Conference Paper2010

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dc.contributor.authorKang, Donghoon-
dc.contributor.authorKim, Jong-Phil-
dc.contributor.authorKim, Jinwook-
dc.contributor.authorKo, Heedong-
dc.date.accessioned2024-01-19T12:39:18Z-
dc.date.available2024-01-19T12:39:18Z-
dc.date.created2022-03-07-
dc.date.issued2010-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/115752-
dc.description.abstractIn this article, we present a robust auto-calibration scheme of the affine sensor model via the spectral decomposition of scale factor matrix and the semi-definite programming (SDP). Inherent benefits of our scheme are the globally optimal estimation of calibration parameters without any additional measurement equipment.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleIdentification Scheme for the Affine Sensor Model-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational Conference on Control, Automation and Systems (ICCAS 2010), pp.115 - 118-
dc.citation.titleInternational Conference on Control, Automation and Systems (ICCAS 2010)-
dc.citation.startPage115-
dc.citation.endPage118-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceGyeonggi do, SOUTH KOREA-
dc.citation.conferenceDate2010-10-27-
dc.relation.isPartOfINTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS (ICCAS 2010)-
dc.identifier.wosid000294964400025-
dc.identifier.scopusid2-s2.0-78751492243-
dc.type.docTypeProceedings Paper-
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KIST Conference Paper > 2010
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