Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Chun, Myung-Suk | - |
dc.contributor.author | Yun, Jang Ho | - |
dc.contributor.author | Kim, Tae Ha | - |
dc.date.accessioned | 2024-01-19T13:09:10Z | - |
dc.date.available | 2024-01-19T13:09:10Z | - |
dc.date.created | 2022-03-07 | - |
dc.date.issued | 2008-06 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/116074 | - |
dc.description.abstract | We have developed the explicit model incorporated together the finite difference scheme for electrokinetic flow in rectangular microchannels encompassing Navier's boundary slip. The externally applied body force originated from between the nonlinear Poisson-Boltzmann field around the channel wall and the flow-induced electric field is employed in the equation of motion. It is evident that the fluid slip counteracts the effect by the electric double layer (EDL) and induces a larger flow rate. Particle streak imaging by fluorescent microscope has been applied to microchannels designed to allow for flow visualization of dilute latex colloids underlying the condition of simple fluid. We recognized the behavior of fluid slip at the hydrophobic surface of polydimethylsiloxane (PDMS) wall, from which the slip length was evaluated for different conditions. | - |
dc.language | English | - |
dc.publisher | CRC PRESS-TAYLOR & FRANCIS GROUP | - |
dc.title | Electrokinetic flows in highly charged micro/nanochannel with Newtonian boundary slip condition | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Nanotechnology Conference and Trade Show (Nanotech 2008), pp.370 - + | - |
dc.citation.title | Nanotechnology Conference and Trade Show (Nanotech 2008) | - |
dc.citation.startPage | 370 | - |
dc.citation.endPage | + | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | Boston, MA | - |
dc.citation.conferenceDate | 2008-06-01 | - |
dc.relation.isPartOf | NSTI NANOTECH 2008, VOL 3, TECHNICAL PROCEEDINGS: MICROSYSTEMS, PHOTONICS, SENSORS, FLUIDICS, MODELING, AND SIMULATION | - |
dc.identifier.wosid | 000272170200097 | - |
dc.identifier.scopusid | 2-s2.0-52649179852 | - |
dc.type.docType | Proceedings Paper | - |
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