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dc.contributor.authorMoon, Jong Sung-
dc.contributor.authorLee, Haneul-
dc.contributor.authorLee, Jin Hee-
dc.contributor.authorJeon, Woong Bae-
dc.contributor.authorLee, Dowon-
dc.contributor.authorLee, Junghyun-
dc.contributor.authorPaik, Seoyoung-
dc.contributor.authorHan, Sang-Wook-
dc.contributor.authorReuter, Rolf-
dc.contributor.authorDenisenko, Andrej-
dc.contributor.authorWrachtrup, Joerg-
dc.contributor.authorLee, Sang-Yun-
dc.contributor.authorKim, Je-Hyung-
dc.date.accessioned2024-01-19T14:00:53Z-
dc.date.available2024-01-19T14:00:53Z-
dc.date.created2022-01-25-
dc.date.issued2021-09-
dc.identifier.issn2330-4022-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/116495-
dc.description.abstractPoint defects in crystals provide important building blocks for quantum applications. Since we optically address these defect qubits, having an efficient optical interface is a highly important aspect. However, conventional confocal fluorescence microscopy of high-refractive-index crystals suffers from limited photon collection efficiency and spatial resolution. Here, we demonstrate high-resolution, high-contrast imaging of defects in diamonds using microsphere-assisted confocal microscopy. A microsphere provides an excellent optical interface for point defects with a magnified virtual image that increases the spatial resolution up to lambda/5, as well as the optical signal-to-noise ratio by four times. These features enable individual optical addressing of single photons and single spins of multiple defects that are spatially unresolved in conventional confocal microscopy, with improved signal contrast. Combined with optical tweezers, this system also demonstrates the possibility of positioning or scanning the microspheres. The approach does not require any complicated fabrication or additional optical systems, but uses simple, off-the-shelf micro-optics. From these distinctive advantages of microspheres, our approach provides an efficient way to image and address closely spaced defects with much better resolution and sensitivity.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.titleHigh-Resolution, High-Contrast Optical Interface for Defect Qubits-
dc.typeArticle-
dc.identifier.doi10.1021/acsphotonics.1c00576-
dc.description.journalClass1-
dc.identifier.bibliographicCitationACS PHOTONICS, v.8, no.9, pp.2642 - 2649-
dc.citation.titleACS PHOTONICS-
dc.citation.volume8-
dc.citation.number9-
dc.citation.startPage2642-
dc.citation.endPage2649-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000697319600011-
dc.identifier.scopusid2-s2.0-85114498774-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusNITROGEN-VACANCY CENTERS-
dc.subject.keywordPlusSINGLE-
dc.subject.keywordPlusMICROSCOPY-
dc.subject.keywordPlusCOHERENCE-
dc.subject.keywordPlusLIGHT-
dc.subject.keywordPlusSPINS-
dc.subject.keywordPlusCOLLECTION-
dc.subject.keywordAuthorpoint defects-
dc.subject.keywordAuthormicrosphere-assisted microscopy-
dc.subject.keywordAuthorsingle photons-
dc.subject.keywordAuthoroptically detected magnetic resonance-
dc.subject.keywordAuthorquantum sensing-
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KIST Article > 2021
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