Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Nam, HD | - |
dc.contributor.author | Song, JD | - |
dc.contributor.author | Choi, WJ | - |
dc.contributor.author | Lee, JI | - |
dc.contributor.author | Yang, HS | - |
dc.date.accessioned | 2024-01-19T14:09:16Z | - |
dc.date.available | 2024-01-19T14:09:16Z | - |
dc.date.created | 2022-03-07 | - |
dc.date.issued | 2005 | - |
dc.identifier.issn | 0272-9172 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/116763 | - |
dc.description.abstract | We have carried out hydrogen-plasma (H-plasma) treatments on a quantum dot infrared photodetector (QDIP) structure, with a 5-stacked InAs dots in an InGaAs well structure and a Al0.3Ga0.7As/GaAs superlattice barrier. The sample structures were grown by molecular beam epitaxy. The H-plasma treatment has been carried out at 150 degrees C for 3 min - 40 min with 40 sccm of H-2 gas flow rate and 10 W of RF power. After H-plasma treatment, photoluminescence (PL) intensities of the samples were slightly reduced compared to that of as-grown sample, without any changes in their PL peak position. The dark currents of H-plasma treated samples were much smaller by many orders of magnitudes than that for as-grown sample. ne sample exposed to H-plasma for 10 min showed the lowest dark current, enabling the observation of photocurrent with a wide spectrum between 3 - 12 mu m at 11 K. | - |
dc.language | English | - |
dc.publisher | MATERIALS RESEARCH SOCIETY | - |
dc.title | Optical and electrical characterization of quantum dot infrared photodetector structure treated with hydrogen-plasma | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Symposium on Semiconductor Defect Engineering-Materials, Synthetic Structures and Devices held at the 2005 MRS Spring Meeting, v.864, pp.533 - 538 | - |
dc.citation.title | Symposium on Semiconductor Defect Engineering-Materials, Synthetic Structures and Devices held at the 2005 MRS Spring Meeting | - |
dc.citation.volume | 864 | - |
dc.citation.startPage | 533 | - |
dc.citation.endPage | 538 | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | San Francisco, CA | - |
dc.citation.conferenceDate | 2005-03-28 | - |
dc.relation.isPartOf | Semiconductor Defect Engineering-Materials, Synthetic Structures and Devices | - |
dc.identifier.wosid | 000231500500077 | - |
dc.identifier.scopusid | 2-s2.0-30544451850 | - |
dc.type.docType | Proceedings Paper | - |
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