Full metadata record

DC Field Value Language
dc.contributor.authorNam, HD-
dc.contributor.authorSong, JD-
dc.contributor.authorChoi, WJ-
dc.contributor.authorLee, JI-
dc.contributor.authorYang, HS-
dc.date.accessioned2024-01-19T14:09:16Z-
dc.date.available2024-01-19T14:09:16Z-
dc.date.created2022-03-07-
dc.date.issued2005-
dc.identifier.issn0272-9172-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/116763-
dc.description.abstractWe have carried out hydrogen-plasma (H-plasma) treatments on a quantum dot infrared photodetector (QDIP) structure, with a 5-stacked InAs dots in an InGaAs well structure and a Al0.3Ga0.7As/GaAs superlattice barrier. The sample structures were grown by molecular beam epitaxy. The H-plasma treatment has been carried out at 150 degrees C for 3 min - 40 min with 40 sccm of H-2 gas flow rate and 10 W of RF power. After H-plasma treatment, photoluminescence (PL) intensities of the samples were slightly reduced compared to that of as-grown sample, without any changes in their PL peak position. The dark currents of H-plasma treated samples were much smaller by many orders of magnitudes than that for as-grown sample. ne sample exposed to H-plasma for 10 min showed the lowest dark current, enabling the observation of photocurrent with a wide spectrum between 3 - 12 mu m at 11 K.-
dc.languageEnglish-
dc.publisherMATERIALS RESEARCH SOCIETY-
dc.titleOptical and electrical characterization of quantum dot infrared photodetector structure treated with hydrogen-plasma-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSymposium on Semiconductor Defect Engineering-Materials, Synthetic Structures and Devices held at the 2005 MRS Spring Meeting, v.864, pp.533 - 538-
dc.citation.titleSymposium on Semiconductor Defect Engineering-Materials, Synthetic Structures and Devices held at the 2005 MRS Spring Meeting-
dc.citation.volume864-
dc.citation.startPage533-
dc.citation.endPage538-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceSan Francisco, CA-
dc.citation.conferenceDate2005-03-28-
dc.relation.isPartOfSemiconductor Defect Engineering-Materials, Synthetic Structures and Devices-
dc.identifier.wosid000231500500077-
dc.identifier.scopusid2-s2.0-30544451850-
dc.type.docTypeProceedings Paper-
Appears in Collections:
KIST Conference Paper > 2005
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE