A new method of carrier density measurement using photocurrent maps of a 2D material Schottky diode

Authors
Ahn, Il-HoAhn, JongtaeHwang, Do KyungKim, Deuk Young
Issue Date
2021-02
Publisher
ELSEVIER
Citation
RESULTS IN PHYSICS, v.21
Abstract
A simple method for obtaining the charge carrier density of two-dimensional (2D) materials is proposed herein. A formula is suggested for the extraction of the 2D charge carrier density using the horizontal depletion width, which is visually represented by photocurrent mapping methods. An example of this method is demonstrated using a MoS2 Schottky diode. The results suggest that this method can be useful for a basic analysis of the physical properties of 2D devices.
Keywords
Carrier concentration; Photocurrent mapping method
ISSN
2211-3797
URI
https://pubs.kist.re.kr/handle/201004/117475
DOI
10.1016/j.rinp.2021.103854
Appears in Collections:
KIST Article > 2021
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