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dc.contributor.authorPark, J.-H.-
dc.contributor.authorPark, J.-G.-
dc.date.accessioned2024-01-19T17:33:58Z-
dc.date.available2024-01-19T17:33:58Z-
dc.date.created2021-09-02-
dc.date.issued2020-05-
dc.identifier.issn2523-3971-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/118701-
dc.description.abstractEffects of cavity material on the Q-factor measurement of microwave dielectric materials were studied by HFSS simulation and the measurements using metal cavity. TE01δ mode resonant frequency was determined from the electric and magnetic field patterns and the Q-factor was calculated from the 3?dB bandwidth of resonant peak at the scattering matrix S21 spectrum. In the cavity resonator method, Cu metal cavity has been generally used. However, the oxidized surface of Cu cavity could generate errors in Q-factor measurements. From the simulation, it is observed that the Q-factor significantly decreased with decreasing conductivity of cavity metal. When the conductivity of the oxidized Cu is assumed as 1000?Ω?1?m?1, the Q-factor could be decreased by 80% compared to pure Cu. ? 2020, Springer Nature Switzerland AG.-
dc.languageEnglish-
dc.publisherSpringer Nature-
dc.subjectAcoustic resonators-
dc.subjectCopper-
dc.subjectDielectric materials-
dc.subjectElectromagnetic simulation-
dc.subjectNatural frequencies-
dc.subjectUncertainty analysis-
dc.subjectCavity materials-
dc.subjectElectric and magnetic fields-
dc.subjectHFSS simulation-
dc.subjectMetal cavities-
dc.subjectMicrowave dielectric materials-
dc.subjectOxidized surfaces-
dc.subjectResonant peaks-
dc.subjectScattering matrices-
dc.subjectQ factor measurement-
dc.titleUncertainty analysis of Q-factor measurement in cavity resonator method by electromagnetic simulation-
dc.typeArticle-
dc.identifier.doi10.1007/s42452-020-2819-8-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSN Applied Sciences, v.2, no.5-
dc.citation.titleSN Applied Sciences-
dc.citation.volume2-
dc.citation.number5-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-85100762040-
dc.type.docTypeArticle-
dc.subject.keywordPlusAcoustic resonators-
dc.subject.keywordPlusCopper-
dc.subject.keywordPlusDielectric materials-
dc.subject.keywordPlusElectromagnetic simulation-
dc.subject.keywordPlusNatural frequencies-
dc.subject.keywordPlusUncertainty analysis-
dc.subject.keywordPlusCavity materials-
dc.subject.keywordPlusElectric and magnetic fields-
dc.subject.keywordPlusHFSS simulation-
dc.subject.keywordPlusMetal cavities-
dc.subject.keywordPlusMicrowave dielectric materials-
dc.subject.keywordPlusOxidized surfaces-
dc.subject.keywordPlusResonant peaks-
dc.subject.keywordPlusScattering matrices-
dc.subject.keywordPlusQ factor measurement-
dc.subject.keywordAuthorCavity-
dc.subject.keywordAuthorDielectric materials-
dc.subject.keywordAuthorMicrowave-
dc.subject.keywordAuthorQ-factor-
dc.subject.keywordAuthorSimulation-
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