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dc.contributor.authorLee, Jaejun-
dc.contributor.authorKwon, Juyoung-
dc.contributor.authorSeo, Dongjea-
dc.contributor.authorNa, Jukwan-
dc.contributor.authorPark, Sangwon-
dc.contributor.authorLee, Hyo-Jung-
dc.contributor.authorLee, Seung-Woo-
dc.contributor.authorLee, Ki-Young-
dc.contributor.authorPark, Tae-Eon-
dc.contributor.authorChoi, Heon-Jin-
dc.date.accessioned2024-01-19T18:34:46Z-
dc.date.available2024-01-19T18:34:46Z-
dc.date.created2021-09-05-
dc.date.issued2019-11-13-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/119330-
dc.description.abstractSince the discovery of graphene, layered transition metal dichalcogenides (TMDs) have been considered promising materials for applications in various fields because of their fascinating structural features and physical properties. Doping in semiconducting TMDs is essential for their practical application. In this regard, two-dimensional (2D) Si materials have emerged as a key component of 2D electronic, optics, sensing, and spintronic devices because of their complementary metal-oxide-semiconductor (CMOS) compatibility, high-quality oxide formation, moderated bandgap, and well-established doping techniques. Here, we report the tuning of the electronic properties of Si nanosheets (NSs) using a plasma-doping technique. Using this doping process, we fabricated p-n homojunction diodes and transistors with Si NSs. The estimated high ON/OFF ratio of similar to 10(6) and field-effect hole mobility of 329 cm(2) V-1 s(-1) suggest a high crystal quality of the Si NSs. We also demonstrate vertically stacked heterostructured p-n junction diodes with MoS2, which exhibit rectifying properties and excellent light response.-
dc.languageEnglish-
dc.publisherAmerican Chemical Society-
dc.subjectSILICON-
dc.subjectGENERATION-
dc.subjectMOBILITY-
dc.titlePlasma-Doped Si Nanosheets for Transistor and p-n Junction Application-
dc.typeArticle-
dc.identifier.doi10.1021/acsami.9b15616-
dc.description.journalClass1-
dc.identifier.bibliographicCitationACS Applied Materials & Interfaces, v.11, no.45, pp.42512 - 42519-
dc.citation.titleACS Applied Materials & Interfaces-
dc.citation.volume11-
dc.citation.number45-
dc.citation.startPage42512-
dc.citation.endPage42519-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000497263600074-
dc.identifier.scopusid2-s2.0-85074757045-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusGENERATION-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordAuthorSi nanosheets-
dc.subject.keywordAuthordoping-
dc.subject.keywordAuthorCMOS compatibility-
dc.subject.keywordAuthortransistors-
dc.subject.keywordAuthorheterostructure-
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