Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Taegeon | - |
dc.contributor.author | Kim, Jin Heung | - |
dc.contributor.author | Choi, Young-Jin | - |
dc.contributor.author | Park, Jae-Gwan | - |
dc.contributor.author | Rho, Heesuk | - |
dc.date.accessioned | 2024-01-19T20:34:48Z | - |
dc.date.available | 2024-01-19T20:34:48Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2019-02-01 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/120367 | - |
dc.description.abstract | We report the Raman results obtained from single GaN, GaN/AlN core-shell, and GaN/AlN branched nanowires (NWs). Polarized Raman spectra from a single GaN NW showed strong anisotropic behavior, in agreement with the Raman polarization selection rules for a wurtzite crystal, indicating the high crystalline quality of the NW. A Raman spectrum from a single GaN NW revealed several optical phonons, including A(1)(TO), A(1)(LO), and E-2(H) phonons at 530.5, 724.2, and 567.0 cm(-1), respectively. Fabricating an AlN shell layer on the side wall of the GaN core NW shifted the GaN A(1)(LO) phonon energy upward by 5.7 cm(-1), indicating that compressive strain occurred in the GaN core. The formation of AlN nanorod branches on the GaN/AlN core-shell surface shifted the A(1)(LO) phonon energy downward toward the value of the GaN NW, indicating a relaxation of the compressive strain in the GaN core. In particular, a broad phonon response was observed at 691.8 cm(-1) on the low-energy shoulder of the GaN A(1)(LO) phonon peak. A careful analysis of this mode identified that the 691.8 cm(-1) mode corresponded to a defect-related phonon, not to a surface optical phonon. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | SCATTERING | - |
dc.subject | PHONONS | - |
dc.subject | GROWTH | - |
dc.title | Polarized Raman studies of single GaN nanowire and GaN/AlN hetero-nanowire structures | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.tsf.2018.12.043 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.671, pp.147 - 151 | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 671 | - |
dc.citation.startPage | 147 | - |
dc.citation.endPage | 151 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000455998000022 | - |
dc.identifier.scopusid | 2-s2.0-85059143986 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | SCATTERING | - |
dc.subject.keywordPlus | PHONONS | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordAuthor | Raman spectroscopy | - |
dc.subject.keywordAuthor | Gallium nitride | - |
dc.subject.keywordAuthor | Aluminum nitride | - |
dc.subject.keywordAuthor | Nanowire | - |
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