Full metadata record

DC Field Value Language
dc.contributor.authorPark, Young Ran-
dc.contributor.authorChoi, Won Kook-
dc.contributor.authorHong, Young Joon-
dc.date.accessioned2024-01-19T21:01:04Z-
dc.date.available2024-01-19T21:01:04Z-
dc.date.created2021-09-02-
dc.date.issued2019-02-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/120406-
dc.description.abstractThis study demonstrates quantum-dot light-emitting diodes (QD-LEDs) with a function of resistive switching memory, capable of on/off operation at the same driving current depending on reset/set state. The QD-LEDs were fabricated by spin-coating process and experienced two different annealing conditions, which yielded defective or less-defective V2O5-x layer. One of the annealing conditions produced QD-LEDs with the unusual electrical behaviors of negative differential resistance (NDR), capacitance oscillation, and voltage-current hysteresis curves, signifying so-called resistive switching characteristics. X-ray and ultraviolet photoelectron spectroscopies were used to examine the chemical state of the differently annealed V2O5-x layers. The less stoichiometric V2O5-x layer was found to be responsible for the resistive switching behaviors of the NDR and the low and high resistance states (LRS and HRS, respectively). We discuss the LRS/HRS of V2O5-x for resistive switching in terms of a conducive filament effect, induced by microstructural changes caused by oxygen drift and vacancy annihilation processes in the high defect density V2O5-x layer.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectMETAL-OXIDES-
dc.subjectPHOTOELECTRON-SPECTROSCOPY-
dc.subjectNANOFILAMENTS-
dc.subjectPERFORMANCE-
dc.subjectRESISTANCE-
dc.subjectDEVICE-
dc.subjectLAYER-
dc.titleResistive switching functional quantum-dot light-emitting diodes-
dc.typeArticle-
dc.identifier.doi10.1016/j.cap.2018.10.021-
dc.description.journalClass1-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.19, no.2, pp.102 - 107-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume19-
dc.citation.number2-
dc.citation.startPage102-
dc.citation.endPage107-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.kciidART002437736-
dc.identifier.wosid000456023200006-
dc.identifier.scopusid2-s2.0-85057483265-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusMETAL-OXIDES-
dc.subject.keywordPlusPHOTOELECTRON-SPECTROSCOPY-
dc.subject.keywordPlusNANOFILAMENTS-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordPlusDEVICE-
dc.subject.keywordPlusLAYER-
dc.subject.keywordAuthorQuantum dot light-emitting diode-
dc.subject.keywordAuthorVanadium pentoxide-
dc.subject.keywordAuthorResistive switching memory-
dc.subject.keywordAuthorNegative differential resistance-
dc.subject.keywordAuthorConducting filament effect-
Appears in Collections:
KIST Article > 2019
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE