Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Park, Young Ran | - |
dc.contributor.author | Choi, Won Kook | - |
dc.contributor.author | Hong, Young Joon | - |
dc.date.accessioned | 2024-01-19T21:01:04Z | - |
dc.date.available | 2024-01-19T21:01:04Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2019-02 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/120406 | - |
dc.description.abstract | This study demonstrates quantum-dot light-emitting diodes (QD-LEDs) with a function of resistive switching memory, capable of on/off operation at the same driving current depending on reset/set state. The QD-LEDs were fabricated by spin-coating process and experienced two different annealing conditions, which yielded defective or less-defective V2O5-x layer. One of the annealing conditions produced QD-LEDs with the unusual electrical behaviors of negative differential resistance (NDR), capacitance oscillation, and voltage-current hysteresis curves, signifying so-called resistive switching characteristics. X-ray and ultraviolet photoelectron spectroscopies were used to examine the chemical state of the differently annealed V2O5-x layers. The less stoichiometric V2O5-x layer was found to be responsible for the resistive switching behaviors of the NDR and the low and high resistance states (LRS and HRS, respectively). We discuss the LRS/HRS of V2O5-x for resistive switching in terms of a conducive filament effect, induced by microstructural changes caused by oxygen drift and vacancy annihilation processes in the high defect density V2O5-x layer. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | METAL-OXIDES | - |
dc.subject | PHOTOELECTRON-SPECTROSCOPY | - |
dc.subject | NANOFILAMENTS | - |
dc.subject | PERFORMANCE | - |
dc.subject | RESISTANCE | - |
dc.subject | DEVICE | - |
dc.subject | LAYER | - |
dc.title | Resistive switching functional quantum-dot light-emitting diodes | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.cap.2018.10.021 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.19, no.2, pp.102 - 107 | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 19 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 102 | - |
dc.citation.endPage | 107 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART002437736 | - |
dc.identifier.wosid | 000456023200006 | - |
dc.identifier.scopusid | 2-s2.0-85057483265 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | METAL-OXIDES | - |
dc.subject.keywordPlus | PHOTOELECTRON-SPECTROSCOPY | - |
dc.subject.keywordPlus | NANOFILAMENTS | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | RESISTANCE | - |
dc.subject.keywordPlus | DEVICE | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordAuthor | Quantum dot light-emitting diode | - |
dc.subject.keywordAuthor | Vanadium pentoxide | - |
dc.subject.keywordAuthor | Resistive switching memory | - |
dc.subject.keywordAuthor | Negative differential resistance | - |
dc.subject.keywordAuthor | Conducting filament effect | - |
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