Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Parmar, Narendra S. | - |
dc.contributor.author | Boatner, Lynn A. | - |
dc.contributor.author | Lynn, Kelvin G. | - |
dc.contributor.author | Choi, Ji-Won | - |
dc.date.accessioned | 2024-01-19T22:00:35Z | - |
dc.date.available | 2024-01-19T22:00:35Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2018-09-07 | - |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/120920 | - |
dc.description.abstract | By using positron annihilation spectroscopy methods, we have experimentally demonstrated the creation of isolated zinc vacancy concentrations >10(20) cm(-3) in chemical vapor transport (CVT)-grown ZnO bulk single crystals. X-ray diffraction omega-rocking curve (XRC) shows the good quality of ZnO single crystal with (110) orientation. The depth analysis of Auger electron spectroscopy indicates the atomic concentrations of Zn and O are almost stoichiometric and constant throughout the measurement. Boltzmann statistics are applied to calculate the zinc vacancy formation energies (E-f) of similar to 1.3-1.52 eV in the sub-surface micron region. We have also applied Fick's 2nd law to calculate the zinc diffusion coefficient to be similar to 1.07 x 10(-14) cm(2)/s at 1100 degrees C. The zinc vacancies began annealing out at 300 degrees C and, by heating in the air, were completely annealed out at 700 degrees C. | - |
dc.language | English | - |
dc.publisher | NATURE PUBLISHING GROUP | - |
dc.subject | POSITRON-ANNIHILATION SPECTROSCOPY | - |
dc.subject | DEFECT | - |
dc.subject | SEMICONDUCTORS | - |
dc.title | Zn Vacancy Formation Energy and Diffusion Coefficient of CVT ZnO Crystals in the Sub-Surface Micron Region | - |
dc.type | Article | - |
dc.identifier.doi | 10.1038/s41598-018-31771-1 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | SCIENTIFIC REPORTS, v.8 | - |
dc.citation.title | SCIENTIFIC REPORTS | - |
dc.citation.volume | 8 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000444022800050 | - |
dc.identifier.scopusid | 2-s2.0-85052989050 | - |
dc.relation.journalWebOfScienceCategory | Multidisciplinary Sciences | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | POSITRON-ANNIHILATION SPECTROSCOPY | - |
dc.subject.keywordPlus | DEFECT | - |
dc.subject.keywordPlus | SEMICONDUCTORS | - |
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