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dc.contributor.authorParmar, Narendra S.-
dc.contributor.authorBoatner, Lynn A.-
dc.contributor.authorLynn, Kelvin G.-
dc.contributor.authorChoi, Ji-Won-
dc.date.accessioned2024-01-19T22:00:35Z-
dc.date.available2024-01-19T22:00:35Z-
dc.date.created2021-09-03-
dc.date.issued2018-09-07-
dc.identifier.issn2045-2322-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/120920-
dc.description.abstractBy using positron annihilation spectroscopy methods, we have experimentally demonstrated the creation of isolated zinc vacancy concentrations >10(20) cm(-3) in chemical vapor transport (CVT)-grown ZnO bulk single crystals. X-ray diffraction omega-rocking curve (XRC) shows the good quality of ZnO single crystal with (110) orientation. The depth analysis of Auger electron spectroscopy indicates the atomic concentrations of Zn and O are almost stoichiometric and constant throughout the measurement. Boltzmann statistics are applied to calculate the zinc vacancy formation energies (E-f) of similar to 1.3-1.52 eV in the sub-surface micron region. We have also applied Fick's 2nd law to calculate the zinc diffusion coefficient to be similar to 1.07 x 10(-14) cm(2)/s at 1100 degrees C. The zinc vacancies began annealing out at 300 degrees C and, by heating in the air, were completely annealed out at 700 degrees C.-
dc.languageEnglish-
dc.publisherNATURE PUBLISHING GROUP-
dc.subjectPOSITRON-ANNIHILATION SPECTROSCOPY-
dc.subjectDEFECT-
dc.subjectSEMICONDUCTORS-
dc.titleZn Vacancy Formation Energy and Diffusion Coefficient of CVT ZnO Crystals in the Sub-Surface Micron Region-
dc.typeArticle-
dc.identifier.doi10.1038/s41598-018-31771-1-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSCIENTIFIC REPORTS, v.8-
dc.citation.titleSCIENTIFIC REPORTS-
dc.citation.volume8-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000444022800050-
dc.identifier.scopusid2-s2.0-85052989050-
dc.relation.journalWebOfScienceCategoryMultidisciplinary Sciences-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.type.docTypeArticle-
dc.subject.keywordPlusPOSITRON-ANNIHILATION SPECTROSCOPY-
dc.subject.keywordPlusDEFECT-
dc.subject.keywordPlusSEMICONDUCTORS-
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